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Ref ID: 28766
Ref Type: Journal Article
Authors: Stanjek, H.
Hausler, W.
Title: Basics of x-ray diffraction
Date: 2004
Source: Hyperfine Interactions
Abstract: X-ray diffraction (XRD) is the most comprehensive tool to identify minerals in complex mineral assemblages. The method is briefly described with special emphasis on clay and ceramics. As an example, an investigation of graphite-containing pottery sherds by XRD is presented. By comparing the measured XRD data with the patterns simulated by the Rietveld method, the graphite content of such samples could be determined.
Date Created: 3/31/2011
Volume: 154
Page Start: 107
Page End: 119